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[ subject:"Electrical engineering." ]
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Analog Fault Modeling, Simulation an...
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Lu, Zhijian.
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Analog Fault Modeling, Simulation and Diagnosis.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Analog Fault Modeling, Simulation and Diagnosis./
作者:
Lu, Zhijian.
面頁冊數:
53 p.
附註:
Source: Masters Abstracts International, Volume: 52-06.
Contained By:
Masters Abstracts International52-06(E).
標題:
Electrical engineering. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1556063
ISBN:
9781303898402
Analog Fault Modeling, Simulation and Diagnosis.
Lu, Zhijian.
Analog Fault Modeling, Simulation and Diagnosis.
- 53 p.
Source: Masters Abstracts International, Volume: 52-06.
Thesis (M.S.)--Arizona State University, 2014.
This item must not be sold to any third party vendors.
The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on the resolution of microscope scan tool, all these defects are categorized into four groups of defects by both function and location, bias circuit defect, first stage amplifier defect, output stage defect and common mode feedback defect, separately. Each fault result is attributed to one of these four region defects.Therefore, analog testing algorithm and automotive tool could be generated to assist testing engineers to meet the demand of large numbers of chips.
ISBN: 9781303898402Subjects--Topical Terms:
649834
Electrical engineering.
Analog Fault Modeling, Simulation and Diagnosis.
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The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on the resolution of microscope scan tool, all these defects are categorized into four groups of defects by both function and location, bias circuit defect, first stage amplifier defect, output stage defect and common mode feedback defect, separately. Each fault result is attributed to one of these four region defects.Therefore, analog testing algorithm and automotive tool could be generated to assist testing engineers to meet the demand of large numbers of chips.
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