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Springer handbook of microscopy
Hawkes, Peter W.

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  • Springer handbook of microscopy
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Springer handbook of microscopy/ edited by Peter W. Hawkes, John C. H. Spence.
    其他作者: Hawkes, Peter W.
    出版者: Cham :Springer International Publishing : : 2019.,
    面頁冊數: xxxii, 1543 p. :ill., digital ;24 cm.
    內容註: Part A: Electron and Ion Microscopy -- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross & Minor: In situ Transmission Electron Microscopy -- Plitzko & Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng & Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy -- Kelly: Atom-Probe Tomography -- Part B: Holography, Ptychography and Diffraction -- Dunin-Borkowski et al.: Electron Holography -- Rodenburg & Maiden: Ptychography -- Zuo: Electron Nanodiffraction -- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction -- Spence: Diffractive Imaging of Single Particles -- Part C: Photon-based Microscopy -- Diaspro et al: Fluorescence Microscopy -- Sahl et al.: Far-Field Fluorescence Microscopy -- Jacobson et al: Zone-Plate X-Ray Microscopy -- Lin et al: Microcomputed Tomography -- Part D: Applied Microscopy -- Huey et al: Scanning Probe Microscopy in Materials Science -- Leary & Midgeley: Electron Tomography in Materials Science -- Sutter: Scanning Tunneling Microscopy in Surface Science -- Hamidian et al: Visualizing electronic quantum matter -- Ma et al (Terasaki): Microscopy of Nanoporous Crystals -- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography -- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences -- Jones: Microscopy in Forensic Sciences.
    Contained By: Springer eBooks
    標題: Microscopy - Handbooks, manuals, etc. -
    電子資源: https://doi.org/10.1007/978-3-030-00069-1
    ISBN: 9783030000691
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