東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁 到查詢結果 [ subject:"Scanning electron microscopy." ]

切換: 標籤 | MARC模式 | ISBD

Scanning electron microscopy and x-r...

Goldstein, Joseph I.

FindBook

Google Book

Amazon

博客來

Scanning electron microscopy and x-ray microanalysis

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Scanning electron microscopy and x-ray microanalysis/ by Joseph I. Goldstein ... [et al.].
其他作者:	Goldstein, Joseph I.
出版者:	New York, NY :Springer New York : : 2018.,
面頁冊數:	xxiii, 550 p. :ill. (some col.), digital ;24 cm.
內容註:	Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.
Contained By:	Springer eBooks
標題:	Scanning electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-1-4939-6676-9
ISBN:	9781493966769

Scanning electron microscopy and x-ray microanalysis
Scanning electron microscopy and x-ray microanalysis[electronic resource] /by Joseph I. Goldstein ... [et al.]. - 4th ed. - New York, NY :Springer New York :2018. - xxiii, 550 p. :ill. (some col.), digital ;24 cm.

Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.

ISBN: 9781493966769

Standard No.: 10.1007/978-1-4939-6676-9doiSubjects--Topical Terms:

551366
Scanning electron microscopy.

LC Class. No.: QH212.S3

Dewey Class. No.: 502.825

Scanning electron microscopy and x-ray microanalysis
LDR:02439nmm a2200313 a 4500 001 2132065
003 DE-He213
005 20180716170422.0
006 m d
007 cr nn 008maaau
008 181005s2018 nyu s 0 eng d
020 $a 9781493966769 $q (electronic bk.)
020 $a 9781493966745 $q (paper)
024 7 $a 10.1007/978-1-4939-6676-9 $2 doi
035 $a 978-1-4939-6676-9
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.S3
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
082 0 4 $a 502.825 $2 23
090 $a QH212.S3 $b S283 2018
245 0 0 $a Scanning electron microscopy and x-ray microanalysis $h [electronic resource] / $c by Joseph I. Goldstein ... [et al.].
250 $a 4th ed.
260 $a New York, NY : $b Springer New York : $b Imprint: Springer, $c 2018.
300 $a xxiii, 550 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.
650 0 $a Scanning electron microscopy. $3 551366
650 1 4 $a Materials Science. $3 890867
650 2 4 $a Characterization and Evaluation of Materials. $3 890988
650 2 4 $a Spectroscopy and Microscopy. $3 1066375
650 2 4 $a Biological Microscopy. $3 890957
650 2 4 $a Spectroscopy/Spectrometry. $3 1084899
650 2 4 $a Measurement Science and Instrumentation. $3 1066390
700 1 $a Goldstein, Joseph I. $3 3298243
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4939-6676-9
950 $a Chemistry and Materials Science (Springer-11644)