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Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Transmission electron microscopy of semiconductor nanostructures/ Andreas Rosenauer.
其他題名:	an analysis of composition and strain state /
作者:	Rosenauer, Andreas,
出版者:	Berlin ;Springer, : c2003.,
面頁冊數:	xii, 238 p. :ill. (some col.), digital ;24 cm.
叢書名:	Springer tracts in modern physics ;
Contained By:	Springer e-books
標題:	Semiconductors - Analysis. -
電子資源:	http://dx.doi.org/10.1007/3-540-36407-2
ISBN:	9783540004141 (paper)

Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
Rosenauer, Andreas,1964-

Transmission electron microscopy of semiconductor nanostructuresan analysis of composition and strain state /[electronic resource] :Andreas Rosenauer. - Berlin ;Springer,c2003. - xii, 238 p. :ill. (some col.), digital ;24 cm. - Springer tracts in modern physics ;182.

ISBN: 9783540004141 (paper)Subjects--Topical Terms:

1004249
Semiconductors
--Analysis.

LC Class. No.: QD139.S34 / R67 2003

Dewey Class. No.: 621.38152

Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
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