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Atomic force microscopy/scanning tun...
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Cohen, Samuel H.
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Atomic force microscopy/scanning tunneling microscopy 2 /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Atomic force microscopy/scanning tunneling microscopy 2 // edited by Samuel H. Cohen and Marcia L. Lightbody.
其他作者:
Cohen, Samuel H.
出版者:
New York :Plenum Press, : c1997.,
面頁冊數:
ix, 250 p. :ill. ;26 cm.
附註:
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
標題:
Atomic force microscopy. -
ISBN:
030645596X$b(hbk.) :
Atomic force microscopy/scanning tunneling microscopy 2 /
Atomic force microscopy/scanning tunneling microscopy 2 /
edited by Samuel H. Cohen and Marcia L. Lightbody. - New York :Plenum Press,c1997. - ix, 250 p. :ill. ;26 cm.
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
Includes bibliographical references and index.
ISBN: 030645596X$b(hbk.) :NT$4870
LCCN: 97009548 Subjects--Topical Terms:
587940
Atomic force microscopy.
LC Class. No.: QH212.A78 / A863 1997
Dewey Class. No.: 502/.8/2
Atomic force microscopy/scanning tunneling microscopy 2 /
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