Atomic force microscopy/scanning tun...
Cohen, Samuel H.

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  • Atomic force microscopy/scanning tunneling microscopy 2 /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    正題名/作者: Atomic force microscopy/scanning tunneling microscopy 2 // edited by Samuel H. Cohen and Marcia L. Lightbody.
    其他作者: Cohen, Samuel H.
    出版者: New York :Plenum Press, : c1997.,
    面頁冊數: ix, 250 p. :ill. ;26 cm.
    附註: "Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
    標題: Atomic force microscopy. -
    ISBN: 030645596X$b(hbk.) :
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F0044073 罕用書庫212室(美崙校區,調書請點預約)(RU_212) 01.外借(書)_YB 一般圖書 QH212.A78 A863 1997 一般使用(Normal) 在架 0
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