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Physical principles of electron micr...

Egerton, R. F.

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Physical principles of electron microscopy : = an introduction to TEM, SEM, and AEM /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Physical principles of electron microscopy :/ Ray F. Egerton.
其他題名:	an introduction to TEM, SEM, and AEM /
作者:	Egerton, R. F.
出版者:	New York :Springer Science+Business Media, : c2005.,
面頁冊數:	xii, 202 p. :ill. ;25 cm.
標題:	Electron microscopy. -
ISBN:	0387258000$b(hbk. : alk. paper) :

Physical principles of electron microscopy : = an introduction to TEM, SEM, and AEM /
Egerton, R. F.

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /Ray F. Egerton. - New York :Springer Science+Business Media,c2005. - xii, 202 p. :ill. ;25 cm.

Includes bibliographical references (p. [195]-196) and index.

ISBN: 0387258000$b(hbk. : alk. paper) :NT$2147

LCCN: 2005924717Subjects--Topical Terms:

598915
Electron microscopy.

LC Class. No.: QH212.E4 / E39 2005

Dewey Class. No.: 502

Physical principles of electron microscopy : = an introduction to TEM, SEM, and AEM /
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100 $a Egerton, R. F. $3 604965
245 1 0 $a Physical principles of electron microscopy : $b an introduction to TEM, SEM, and AEM / $c Ray F. Egerton.
260 $a New York : $c c2005. $b Springer Science+Business Media,
300 $a xii, 202 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references (p. [195]-196) and index.
650 $a Electron microscopy. $3 598915