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IDDQ testing of VLSI circuits /
~
Gulati, Ravi K.
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IDDQ testing of VLSI circuits /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
IDDQ testing of VLSI circuits // edited by Ravi K. Gulati and Charles F. Hawkins.
其他作者:
Gulati, Ravi K.
出版者:
Boston :Kluwer Academic Publishers, : c1993.,
面頁冊數:
120 p. :ill. ;27 cm.
附註:
"A Special issue of Journal of electronic testing: theory and applications."
叢書名:
Frontiers in electronic testing
標題:
Iddq testing. -
ISBN:
0792393155 :
IDDQ testing of VLSI circuits /
IDDQ testing of VLSI circuits /
edited by Ravi K. Gulati and Charles F. Hawkins. - Boston :Kluwer Academic Publishers,c1993. - 120 p. :ill. ;27 cm. - Frontiers in electronic testing.
"A Special issue of Journal of electronic testing: theory and applications."
Includes bibliographical references and index.
ISBN: 0792393155 :f157.50
LCCN: 92039926 //r94Subjects--Topical Terms:
649633
Iddq testing.
LC Class. No.: TK7874 / .I3223 1993
Dewey Class. No.: 621.39/5
IDDQ testing of VLSI circuits /
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IDDQ testing of VLSI circuits /
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edited by Ravi K. Gulati and Charles F. Hawkins.
260
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Boston :
$c
c1993.
$b
Kluwer Academic Publishers,
300
$a
120 p. :
$b
ill. ;
$c
27 cm.
440
0
$a
Frontiers in electronic testing
500
$a
"A Special issue of Journal of electronic testing: theory and applications."
500
$a
"Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4."
500
$a
DDQ is subscript in IDDQ in title; testing method also known as quiescent current testing.
504
$a
Includes bibliographical references and index.
650
$a
Iddq testing.
$3
649633
650
$a
Integrated circuits
$x
Very large scale integration
$x
Testing.
$3
629092
650
$a
Metal oxide semiconductors, Complementary
$x
Testing.
$3
649634
700
$a
Gulati, Ravi K.
$3
649631
700
$a
Hawkins, Charles F.
$3
649632
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罕用書庫221室(美崙校區,調書請點預約)(RU_221)
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W0011243
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
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TK7874 I3223 1993
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