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Proceedings : = 1993 IEEE Computer S...

IEEE Computer Society., Technical Committee on Machine Intelligence and Pattern Analysis.

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Proceedings : = 1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 15-18, 1993, New York City, New York /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Proceedings :/ sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
其他題名:	1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 15-18, 1993, New York City, New York /
團體作者:	IEEE Computer Society Conference on Computer Vision and Pattern Recognition
出版者:	Los Alamitos, CA :IEEE Computer Society Press, : c1993.,
面頁冊數:	xviii, 804 p. :ill. ;28 cm.
標題:	Computer vision - Congresses. -
ISBN:	081863880X (paper) :

Proceedings : = 1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 15-18, 1993, New York City, New York /
Proceedings :1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 15-18, 1993, New York City, New York /sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence. - Los Alamitos, CA :IEEE Computer Society Press,c1993. - xviii, 804 p. :ill. ;28 cm.

Includes bibliographical references and index.

ISBN: 081863880X (paper) :US122.00Subjects--Topical Terms:

570734
Computer vision
--Congresses.

LC Class. No.: TA1632 / .I36 1993

Proceedings : = 1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 15-18, 1993, New York City, New York /
LDR:00750nam a2200181 a 45 001 666553
003 OCoLC
005 19951104130732.0
008 930723s1993 caua b 101 0 eng d
020 $a 081863880X (paper) : $c US122.00
020 $a 0818638818 (microfiche)
020 $a 0818638826 (case)
035 $a dt 00015136
040 $a NSL $c NSL
050 $a TA1632 $b .I36 1993
111 $a IEEE Computer Society Conference on Computer Vision and Pattern Recognition $d (1993 : $c New York City) $3 695827
245 1 0 $a Proceedings : $b 1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 15-18, 1993, New York City, New York / $c sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
260 $a Los Alamitos, CA : $c c1993. $b IEEE Computer Society Press,
300 $a xviii, 804 p. : $b ill. ; $c 28 cm.
504 $a Includes bibliographical references and index.
650 $a Computer vision $x Congresses. $3 570734
650 $a Pattern recognition systems $v Congresses. $3 563039
710 $a IEEE Computer Society. $b Technical Committee on Machine Intelligence and Pattern Analysis. $3 695826