東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Proceedings : = International Test C...

IEEE Computer Society., Test Technology Technical Committee.

FindBook

Google Book

Amazon

博客來

Proceedings : = International Test Conference 1994 /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Proceedings :/ [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
其他題名:	International Test Conference 1994 /
團體作者:	International Test Conference
出版者:	Altoona, PA :The Conference ; : c1994,
面頁冊數:	xi, 1033 p. :ill. ;28 cm.
附註:	"IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.
標題:	Electronic digital computers - Circuits -
ISBN:	0780321022 (softbound)

Proceedings : = International Test Conference 1994 /
Proceedings :International Test Conference 1994 /[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]. - Altoona, PA :The Conference ;c1994 - xi, 1033 p. :ill. ;28 cm.

"IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.

Includes bibliographical references and index.

ISBN: 0780321022 (softbound)

LCCN: 94078172Subjects--Topical Terms:

695883
Electronic digital computers
--Circuits

LC Class. No.: TK7874 / .I593 1994

Proceedings : = International Test Conference 1994 /
LDR:01064nam a2200253 a 45 001 666582
003 OCoLC
005 19990917135202.9
008 941021s1994 paua b 001 0 eng d
010 $a 94078172
020 $a 0780321022 (softbound)
020 $a 0780321030 (casebound) : $c US134.00
020 $a 0780321049 (microfiche)
035 $a dt 00015202
040 $a RBL $c RBL
050 $a TK7874 $b .I593 1994
111 $a International Test Conference $n (25th : $d 1994 : $c Washington D.C) $3 695882
245 1 0 $a Proceedings : $b International Test Conference 1994 / $c [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
260 $a Altoona, PA : $a Piscataway, N.J. : $c c1994 $b The Conference ; $b additional copies can be ordered from IEEE Service Center,
300 $a xi, 1033 p. : $b ill. ; $c 28 cm.
500 $a "IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.
500 $a Cover title: Test : the next 25 years.
500 $a Spine title: International Test Conference 1994 : proceedings.
504 $a Includes bibliographical references and index.
650 $a Electronic digital computers $x Circuits $x Testing $x Congresses. $3 695883
650 $a Integrated circuits $x Testing $x Congresses. $3 659601
650 $a TEST: The Next 25 Years $3 695884
710 $a IEEE Computer Society. $b Test Technology Technical Committee. $3 659597
710 $a Institute of Electrical and Electronics Engineers. $3 595741
740 0 1 $a International Test Conference 1994 : proceedings.
740 0 1 $a Test : the next 25 years.