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Semiconductor material and device ch...
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Schroder, Dieter K.
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Semiconductor material and device characterization /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Semiconductor material and device characterization // Dieter K. Schroder.
作者:
Schroder, Dieter K.
出版者:
[Piscataway, NJ] :IEEE Press ; : c2006.,
面頁冊數:
xv, 779 p. :ill. ;25 cm.
附註:
"Wiley-Interscience."
標題:
Semiconductors - Testing. -
電子資源:
http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.htmlhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html
電子資源:
http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.htmlhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html
ISBN:
0471739065 (acid-free paper)
Semiconductor material and device characterization /
Schroder, Dieter K.
Semiconductor material and device characterization /
Dieter K. Schroder. - 3rd ed. - [Piscataway, NJ] :IEEE Press ;c2006. - xv, 779 p. :ill. ;25 cm.
"Wiley-Interscience."
Includes bibliographical references and index.
ISBN: 0471739065 (acid-free paper)
LCCN: 2005048514
Nat. Bib. No.: GBA573304bnb
Nat. Bib. Agency Control No.: 013282982UkSubjects--Topical Terms:
699774
Semiconductors
--Testing.
LC Class. No.: QC611 / .S335 2006
Dewey Class. No.: 621.3815/2
Semiconductor material and device characterization /
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