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World class reliability : = using Mu...
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Bhote, Adi K.
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World class reliability : = using Multiple Environment Overstress Tests to make it happen /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
World class reliability :/ Keki R. Bhote and Adi K. Bhote.
其他題名:
using Multiple Environment Overstress Tests to make it happen /
作者:
Bhote, Keki R.,
其他作者:
Bhote, Adi K.
出版者:
New York :American Management Association, : c2004.,
面頁冊數:
xix, 218 p. :ill. ;24 cm.
標題:
Reliability (Engineering). -
電子資源:
http://www.loc.gov/catdir/toc/ecip048/2003019970.htmlhttp://www.loc.gov/catdir/toc/ecip048/2003019970.html
ISBN:
0814407927 :
World class reliability : = using Multiple Environment Overstress Tests to make it happen /
Bhote, Keki R.,1925-.
World class reliability :
using Multiple Environment Overstress Tests to make it happen /Keki R. Bhote and Adi K. Bhote. - New York :American Management Association,c2004. - xix, 218 p. :ill. ;24 cm.
Includes bibliographical references (p. 209-210) and index.
ISBN: 0814407927 :US39.95
LCCN: 2003019970Subjects--Topical Terms:
752370
Reliability (Engineering).
LC Class. No.: TA169 / .B48 2004
Dewey Class. No.: 620/.00452
World class reliability : = using Multiple Environment Overstress Tests to make it happen /
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